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Vol. 11, Special Issue 5 (2022)

Analysis of genetic variability, heritability and genetic advance for yield & yield associated traits in wheat

Author(s):
Pooja Khinchi, HK Jaiswal and Aarti Sharma
Abstract:
The present study was undertaken to explore the charaters highly responsible for yield of wheat. Genetic variability, heritability and genetic advance for yield and yield associated characters were studied for 64 wheat genotypes and data were recorded on days to heading, days to maturity, plant height, flag leaf length, spike length, spike per plant, spikelet per spike, grains per spike, test weight and yield per plant. The experiment was carried out in Randomized block design with two replications. Spikes per plant, Grain yield per plant, Flag leaf length, Spike length, grains per spike, spikelet’s per spike, Days to 50 percent heading showed relatively high Genotypic coefficient of variation (GCV) & Phenotypic coefficient of variation estimates (PCV). The PCV were higher than GCV for all ten traits showing that they all interacted with the environment to some extent. High heritability was obtained for Days to heading (96.8%), Flag leaf length (81.6%), Plant height (80%), Yield (76.3%) & Spike length (63.4) which indicates High heritable portion of variation. High to medium estimates of genetic advance were obtained for plant yield (41.15), Flag leaf length (27.34), Spike length (17.27), & Plant height (16.73) indicating the roles of additive gene action & a good scope of selection using their phenotypic performance. So it concluded that Flag leaf length, Spike length, Plant height may be targeted as selection criteria in wheat breeding programs.
Pages: 1105-1109  |  348 Views  220 Downloads
How to cite this article:
Pooja Khinchi, HK Jaiswal and Aarti Sharma. Analysis of genetic variability, heritability and genetic advance for yield & yield associated traits in wheat. The Pharma Innovation Journal. 2022; 11(5S): 1105-1109.

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