Vol. 11, Special Issue 2 (2022)

Author(s):
Altaf Ahmad Wani, Farooq Ahmad Bhat, Raheeba Tun Nisa, Tanveer Ahmad Wani, Waseem Raja, Shaheen Kausar Jan, Tariq Rasool Rather, Nahida Anjum, Mohammad Akeel Wani and Peerzada Mohammad Mussadiq

Abstract:
Common bean is prone to a number of fungal, bacterial, viral, mycoplasma and nematode diseases which affect its stem, tendrils, leaves, pods and roots. Amongst them, angular leaf spot (Phaeoisariopsis griseola), anthracnose (Colletotrichum lindemuthianum), alternaria leaf blight (Alternaria alternata), rust (Uromyces appendiculatus), white mold (Sclerotinia sclerotiorum), bacterial leaf spot and blight (Xanthomonas campestris pv phaseoli), damping off and stem rot (Rhizoctonia solani), wilt and root rot (Fusarium spp; Phytophthora spp and Pythium spp) are economically most important diseases (Trutman and Keane, 1990) ^[111]. Bean yield losses have been demonstrated to be caused by a reduction in the size of the pods. Bean yield losses have been demonstrated to be caused by a drop in seed size and seed mass/pod rather than a reduction in pod number/plant (Santos et al., 1978). Rather than in the pod number/plant, seeds and seed mass/pod (Santos et al., 1978). Cole (1966)^[39] and Hagedorn and Wade (1974)^[57] estimated that the disease caused up to 50% yield losses. Yield losses of 40-80% have been documented in Colombia (Barros et al., 1958a; Schwartz et al., 1981; Pastor and Correa, 1983)^{[13, 98, 82]}, 80 percent in Maxico (Crispin et al., 1976)^[44], 30-40% in Argentina (Fortugno, 1974)^[49] and 70% in Brazil (Brenes et al., 1983; Rava et al., 1985; Sartorato and Rava, 1992)^{[23, 88, 96]}. The subject on “Bean Angular Leaf Spot (Phaeoisariopsis griseola): Epidemiology and Yield Loss Assessment in Kashmir” has been reviewed as follows.