Vol. 7, Issue 10 (2018)

Author(s):
Sukram Thapa, Prateek Madhav Bhattacharya and Deewakar Baral

Abstract:
Spot blotch of wheat is caused by Bipolaris sorokoniana is one of the major disease of wheat which causes a considerable yield loss throughout the wheat growing areas in the world. Other than spot blotch this pathogen is reported to cause common root rot, foot rot, seedling blight and seed rot disease. Growing of resistant varieties and varieties with different phenological traits related with resistance to spot blotch disease can be an effective way of managing the disease. In this experiment different phenotypic traits for resistance to spot blotch were observed to explain the disease. Among the different phenotypic traits observed, phenological traits (onset of reproductive phase and maturity), symptomatological trait (lesion number), morphological trait (plant height), physiological trait canopy temperature (AUCTPC), chlorophyll content (AUSDC) and stay green property of the genotypes were found to explain 61 percent in the disease variation. Therefore these traits can be used as diagnostic traits for selecting spot blotch resistant wheat genotypes.